The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2016
Filed:
Dec. 20, 2012
Konogan Baranton, Charenton-le-Pont, FR;
Fabien Divo, Charenton-le-Pont, FR;
Guilhem Escalier, Charenton-le-Pont, FR;
Martha Hernandez-castaneda, Charenton-le-Pont, FR;
Gildas Marin, Charenton-le-Pont, FR;
Pedro Ourives, Charenton-le-Pont, FR;
Benjamin Rousseau, Charenton-le-Pont, FR;
Konogan Baranton, Charenton-le-Pont, FR;
Fabien Divo, Charenton-le-Pont, FR;
Guilhem Escalier, Charenton-le-Pont, FR;
Martha Hernandez-Castaneda, Charenton-le-Pont, FR;
Gildas Marin, Charenton-le-Pont, FR;
Pedro Ourives, Charenton-le-Pont, FR;
Benjamin Rousseau, Charenton-le-Pont, FR;
ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE), Charenton le Pont, FR;
Abstract
Device and method for determining an objective eye refraction parameter of a subject depending on a plurality of gaze directions, the device includes elements for ophthalmologically measuring an objective eye refraction parameter of a subject, and elements of visual stimulation of variable proximity and intended to stimulate the visual accommodation of the subject for first and second proximity values. The device includes opto-mechanical alignment elements for carrying out a first optical alignment of the optical axis of measurement on an eye axis in a first measuring position corresponding to a first angle of lowered viewing associated with a first proximity value to take a first measurement of an objective eye refraction parameter of the subject, and a second alignment of the optical axis of measurement on the eye axis in another measuring position corresponding to another angle of lowered viewing associated with another proximity value to take a second measurement.