The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

Jul. 02, 2013
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Osman Yilmaz, Espoo, FI;

Pekka Janis, Espoo, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 24/08 (2009.01); H04W 40/14 (2009.01); H04W 28/08 (2009.01); H04W 36/00 (2009.01); H04B 17/318 (2015.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04B 17/318 (2015.01); H04W 24/10 (2013.01); H04W 28/085 (2013.01); H04W 36/0088 (2013.01); H04W 40/14 (2013.01);
Abstract

A method and apparatus can be configured to measure channel conditions of a first channel (). The first channel can correspond to a first frequency. The method can also include predicting whether the channel conditions of a second channel are favorable for offloading communication occurring on the first channel to the second channel based on measurements performed on the first channel (). The second channel can correspond to a second frequency. The second frequency can be higher than the first frequency. The method can also include determining a rate of occurrence for monitoring the second channel based on the results of the predicting ().


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