The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

May. 12, 2014
Applicant:

Leica Biosystems Imaging, Inc., Vista, CA (US);

Inventors:

Greg J. Crandall, Rancho Santa Fe, CA (US);

Ole Eichhorn, Westlake Village, CA (US);

Allen H. Olson, San Diego, CA (US);

Dirk G. Soenksen, Carlsbad, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 5/232 (2006.01); H04N 7/18 (2006.01); G02B 21/00 (2006.01); G02B 21/26 (2006.01); G02B 21/32 (2006.01); G02B 21/34 (2006.01); G02B 21/36 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23206 (2013.01); G02B 21/002 (2013.01); G02B 21/26 (2013.01); G02B 21/32 (2013.01); G02B 21/34 (2013.01); G02B 21/365 (2013.01); G02B 21/367 (2013.01); H04N 7/18 (2013.01); H04N 7/183 (2013.01); G02B 21/245 (2013.01);
Abstract

Systems and methods for capturing image data using a line scan camera. In an embodiment, a line scan camera captures image data of a sample as a plurality of image stripes. A processor may coarsely align two or more of the plurality of image stripes according to a synchronization process while the line scan camera is capturing at least one of the plurality of image stripes. Subsequently, the processor may also finely align the two or more image stripes using pattern matching.


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