The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Feb. 28, 2014
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Hyoungyoul Yu, Seoul, KR;
Younsun Kim, Gyeonggi-do, KR;
Hyojin Lee, Seoul, KR;
Seunghoon Choi, Gyeonggi-do, KR;
Samsung Electronics Co., Ltd, , KR;
Abstract
An Interference Measurement Resource (IMR) allocation method and apparatus for allocating resources for efficient interference measurement in a downlink in a system supporting a New Carrier Type (NCT) is provided. The interference measurement configuration method of a base station transmitting subframes including, or not including, Cell-specific Reference Signals (CRS) in a wireless communication system includes determining whether a terminal supports a New Carrier Type (NCT) subframe, allocating, when the terminal supports the NCT subframe, Interference Measurement Resources (IMR) to the terminal at Resource Elements (REs) where other signals are not mapped in the subframe, transmitting information on the allocated IMR to the terminal, and transmitting the subframe including the allocated IMR to the terminal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile