The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

Jan. 08, 2014
Applicant:

Hong Kong Applied Science and Technology Research Institute Co. Ltd., New Territories, HK;

Inventor:

Yan Wang, Kowloon, HK;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/50 (2006.01); G06T 7/00 (2006.01); G06F 3/042 (2006.01); G06F 3/038 (2013.01);
U.S. Cl.
CPC ...
G06T 7/0085 (2013.01); G06F 3/038 (2013.01); G06F 3/042 (2013.01); G06F 3/0425 (2013.01); G06T 7/0097 (2013.01);
Abstract

A method of determining an edge of an object on a digital image sequence comprising the step of determining a first gradient direction profile of a first image in the digital image sequence; determining a second gradient direction profile of a second image in the digital image sequence; computing a differential profile based on the first gradient direction profile and the second gradient direction profile; and determining the edge of the object based on the differential profile wherein the differential profile registers gradient magnitudes of the second gradient direction profile and angular differences between the first gradient direction profile and the second gradient direction profile. A system thereof is also disclosed.


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