The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

Jan. 30, 2015
Applicant:

Nidek Co., Ltd., Aichi, JP;

Inventors:

Kazunari Shimizu, Aichi, JP;

Yukinobu Ban, Aichi, JP;

Tetsuya Yamamoto, Aichi, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/103 (2006.01); A61B 3/107 (2006.01); A61B 3/11 (2006.01); A61B 3/14 (2006.01); A61B 3/117 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0061 (2013.01); A61B 3/0025 (2013.01); A61B 3/10 (2013.01); A61B 3/103 (2013.01); A61B 3/1005 (2013.01); A61B 3/107 (2013.01); A61B 3/1015 (2013.01); A61B 3/112 (2013.01); A61B 3/14 (2013.01); A61B 3/117 (2013.01); G06T 2207/30041 (2013.01);
Abstract

An ophthalmic image processing method includes: acquiring information about characteristics of an examinee's eye including corneal information about the corneal anterior surface shape of the examinee's eye, and refractivity information about refraction of the examinees eye as a whole; generating a simulation image of a target image formed at fundus of the examinee's eye using the refractivity information; and simultaneously displaying an eyeball model image showing an eyeball structure, the simulation image, and a corneal information image associated with the cornea on the eyeball model image and corresponding to the corneal information.


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