The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Jul. 22, 2013
Datalogic Adc, Inc., Eugene, OR (US);
WenLiang Gao, Eugene, OR (US);
Jeffrey J. Hoskinson, Eugene, OR (US);
Datalogic ADC, Inc., Eugene, OR (US);
Abstract
Calibrating extrinsic parameters of an imaging system in an automated data reading system includes obtaining, from the imaging system, image data representing an imaged portion of a planar calibration target. The target is coupled to a housing of the automated data reading system and superimposed on a surface thereof. For example, the calibration target is placed on a conveyer surface, or it is printed on the housing of the automated data reading system. The imaged portion of the planar calibration target includes spaced-apart optical codes disposed at positions that coincide with predetermined locations of the automated data reading system to define known calibration-control points for the surface. Optical codes represented in the image data are decoded to obtain observed calibration-control points used for calibrating the extrinsic parameters based on differences between the known and observed locations of the calibration-control points.