The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Jul. 13, 2007
Zhong Jie LI, Beijing, CN;
He Hui Liu, Beijing, CN;
Naomi M. Mitsumori, San Jose, CA (US);
Krishna Ratakonda, Yorktown Heights, NY (US);
Hua Fang Tan, Beijing, CN;
Jun Zhu, Beijing, CN;
Zhong Jie Li, Beijing, CN;
He Hui Liu, Beijing, CN;
Naomi M. Mitsumori, San Jose, CA (US);
Krishna Ratakonda, Yorktown Heights, NY (US);
Hua Fang Tan, Beijing, CN;
Jun Zhu, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques are provided for analyzing testing coverage of one or more software modules to provide process coverage statistics. The techniques include obtaining one or more coverage measures from a test specification document, performing a trace on each of the one or more coverage measures during a test, analyzing each trace to generate a run-time service choreography model for a process, wherein the model includes each of one or more service choreography patterns occurring in the process, and using the model to provide statistical data on test coverage according to a process definition.