The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Nov. 04, 2011
Fook Chiong Cheong, New York, NY (US);
KE Xiao, Elmhurst, NY (US);
David Pine, New York, NY (US);
David G. Grier, New York, NY (US);
Fook Chiong Cheong, New York, NY (US);
Ke Xiao, Elmhurst, NY (US);
David Pine, New York, NY (US);
David G. Grier, New York, NY (US);
New York University, New York, NY (US);
Abstract
A method for analyzing porosity of a particle and a medium disposed in the porosity of the particle. A video-holographic microscope is provided to analyze interference patterns produced by providing a laser source to output a collimated beam, scattering the collimated beam off a particle and interacting with an unscattered beam to generate the interference pattern for analyzation to determine the refractive index of the particle and a medium disposed in the porosity of the particle to measure porosity and the medium.