The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9519068 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 13, 2016

Filed:

Nov. 08, 2012
Applicant:

Ibex Innovations Ltd, Sedgefield, GB;

Inventor:

Gary Gibson, Sedgefield, GB;

Assignee:

IBEX INNOVATIONS LTD., Sedgefield, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/00 (2006.01); G01N 23/00 (2006.01); G01T 1/20 (2006.01); G01T 1/29 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G01T 1/20 (2013.01); G01N 23/04 (2013.01); G01T 1/2985 (2013.01);
Abstract

X-ray imaging apparatus, which includes an x-ray detector. The x-ray detector comprises a member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test. The structure lies between the x-ray source and the member to one side of the position for material under test intersecting the common axis, and the said structure comprises at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.


Find Patent Forward Citations

Loading…