The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

Apr. 16, 2014
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Bo Ra Kim, Daejeon, KR;

Nikolai Simonov, Daejeon, KR;

Seong-Ho Son, Daejeon, KR;

Soon Ik Jeon, Daejeon, KR;

Hyuk Je Kim, Daejeon, KR;

Jong Moon Lee, Daejeon, KR;

Hyung Do Choi, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/89 (2006.01); G01S 13/88 (2006.01);
U.S. Cl.
CPC ...
G01S 13/89 (2013.01); G01S 13/88 (2013.01); G01S 13/887 (2013.01); G01S 13/888 (2013.01);
Abstract

A method for reconstructing a dielectric image using electromagnetic waves, comprising: acquiring a measurement value of the electromagnetic waves; generating a matching system matrixes between the meshes; generating a smoothed dyadic Green's function matrix; generating an electromagnetic wave calculation value; calculating a misfit error between the acquired electromagnetic wave measurement value and the generated electromagnetic wave calculation value, and checking whether a change of the calculated misfit error satisfies a predetermined optimization determination condition; updating dielectric parameters at the meshes; and outputting a reconstructed dielectric image in the image reconstruction region.


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