The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

Jan. 06, 2016
Applicant:

Zih Corp., Lincolnshire, IL (US);

Inventor:

Robert W. Boyd, Eidson, TN (US);

Assignee:

ZIH Corp., Lincolnshire, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); G01S 5/06 (2006.01); G01S 5/02 (2010.01); H04W 64/00 (2009.01); H04W 84/12 (2009.01);
U.S. Cl.
CPC ...
G01S 5/06 (2013.01); G01S 5/021 (2013.01); G01S 5/0215 (2013.01); G01S 5/0221 (2013.01); H04W 64/00 (2013.01); H04W 84/12 (2013.01);
Abstract

Systems and methods for determining signal source location in wireless local area networks are disclosed. An example method includes receiving, from a first signal reader, a first time-of-arrival measurement for a first radio frequency (RF) signal generated by a first wireless local area network (WLAN) signal source located at a first known location, the first time-of-arrival measurement being relative to a first clock of the first signal reader; receiving, from a second signal reader, a second time-of-arrival measurement for the RF signal, the second time-of-arrival measurement being relative to a second clock of the second signal reader, wherein the first clock is not synchronized with the second clock; defining a first time relationship between the first clock and a system time based on the first time-of-arrival measurement; and defining a second time relationship between the second clock and the system time based on the second time-of-arrival measurement.


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