The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Aug. 21, 2014
Qualcomm Incorporated, San Diego, CA (US);
Mahadevamurty Nemani, San Diego, CA (US);
QUALCOMM INCORPORATED, San Diego, CA (US);
Abstract
Systems and methods for calibrating on-die analog current sensors are disclosed. The methods can be routinely applied to perform a calibration such as during a system initialization or boot procedure or during other times when the system is in a sleep or power saving mode of operation. The systems determine a leakage current in the device under present environmental conditions. A baseline load current determined under the present temperature and input voltage is retrieved and used to determine a total leakage current. A reproducible and stable dynamic load is controllably applied to provide a known current to the on-die analog current sensor. A third mechanism permits repeatable adjustments to the known current that span the operational range of the on-die integrated current sensor. The responsiveness of the disclosed mechanisms ensures that temperature induced leakage does not increase significantly during a current sensor calibration.