The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Jan. 25, 2013
Msc & Sgcc, Vourles, FR;
Marc Leconte, Loire sur Rhone, FR;
Bernard Lopez, Lyons, FR;
MSC & SGCC, Vourles, FR;
Abstract
A method of inspecting articles of transparent/translucent material with a vision system comprises illuminating the articles with a light source having an angular spectrum that is adapted to the contrast selected for refractive items presented by the articles. An image sensor picks up the light that has passed through the articles to make images of the articles. During a stage of referencing the vision system, a reference standard is in the field of view of the image sensor, the standard including at least one standard item that refracts light in a known range of angles. An image of the standard is taken to measure at least the contrast in the image produced by at least one standard item. During at least one stage of qualifying the vision system, the standard is placed once more in front of the light source and in the field of view of the image sensor.