The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
May. 20, 2015
Keyence Corporation, Osaka, JP;
Manabu Kido, Osaka, JP;
Keyence Corporation, Osaka, JP;
Abstract
An inspection apparatus includes: an imaging section for capturing a first reference image by simultaneously turning on three or more illumination sections, and a second reference image at imaging timing temporally after the first reference image; a tracking target image designating section for designating a tracking target image in the first reference image and is used for tracking a position of the workpiece; a corresponding position estimating section for searching a position of the tracking target image designated by the tracking target image designating section from the second reference image, and specifying a position including the tracking target image in the second reference image, to estimate a corresponding relation of pixels that correspond among each of the partial illumination images; and an inspection image generating section for generating an inspection image for photometric stereo based on the corresponding relation of each of the pixels of the partial illumination images.