The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

Mar. 05, 2013
Applicant:

The Foundation for the Promotion of Industrial Science, Tokyo, JP;

Inventors:

Keiji Sakai, Tokyo, JP;

Tomoki Ishiwata, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 13/02 (2006.01); G01N 11/00 (2006.01); G01N 11/16 (2006.01);
U.S. Cl.
CPC ...
G01N 13/02 (2013.01); G01N 11/00 (2013.01); G01N 11/16 (2013.01); G01N 2011/008 (2013.01); G01N 2013/0241 (2013.01); G01N 2013/0258 (2013.01);
Abstract

An object is to measure a mechanical property of a fluid at a temporal resolution of at least 100 [μs]. Therefore, a method comprising: causing a dropletto fly by ejecting a fluid to be measured from a nozzleas the droplet; generating an electric field in a space around a flight pathof the dropletby applying a voltage to an electrode arranged in the vicinity of the flight path; deforming the dropletin a way of contactless deformation with a dielectric force induced by the electric field; and measuring a mechanical property of the fluid based on temporal variation of deformation state of the dropletafter deforming the droplet


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