The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Jul. 18, 2011
Ghatu Subhash, Gainesville, FL (US);
Bruce A. Welt, Gainesville, FL (US);
Ghatu Subhash, Gainesville, FL (US);
Bruce A. Welt, Gainesville, FL (US);
University of Florida Research Foundation, Incorporated, Gainesville, FL (US);
Abstract
Testing methods and equipment are provided for fast, non-destructive testing of the quality of seal and/or integrity of a package. According to certain embodiments, dynamic impact characterization is used to determine whether a loss of pressure due to a leak in the package occurs. The methods and equipment can be used in-line with product packaging processes. According to one embodiment, an initial pressure is applied to a package under test. A region of the package is impacted with a force sufficient to create a disturbance to the package while not destroying the package by using an impacting rod. Force sensors/transducers contact with the package and spaced a distance away from the impact region of the package detect a force signature from the impact. The existence of a leak is determined by evaluating the force signature.