The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

Jul. 22, 2014
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Gary E. Georgeson, Tacoma, WA (US);

William Joseph Tapia, Kapowsin, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01L 5/00 (2006.01); G01M 5/00 (2006.01); G01N 3/00 (2006.01); G01N 27/90 (2006.01); B64F 5/00 (2006.01); G01P 15/06 (2006.01); G01L 5/14 (2006.01); H01H 29/00 (2006.01); H01H 35/14 (2006.01);
U.S. Cl.
CPC ...
G01L 1/247 (2013.01); B64F 5/0045 (2013.01); G01L 5/0052 (2013.01); G01L 5/14 (2013.01); G01M 5/0083 (2013.01); G01N 3/00 (2013.01); G01N 27/90 (2013.01); G01P 15/06 (2013.01); H01H 29/002 (2013.01); H01H 35/146 (2013.01);
Abstract

Systems and methods using fluid-filled hollow microspheres to assist in monitoring or indicating high-energy blunt impacts on structures such as aircraft. A multiplicity of microspheres may be adhered to or embedded in a coating applied on a surface of a substrate (e.g., a tape or an appliqué), which substrate in turn can be adhered to a surface of a structure to be monitored. The microspheres are designed to rupture at one or more specified pressure thresholds. In some embodiments, the microspheres are filled with electrically conductive fluid which, if released from ruptured microsphere, changes the electromagnetic state of the substrate. In response to the detection of a sufficiently large change in the electromagnetic state of the substrate, a blunt impact indication is generated. The impact site may then undergo non-destructive inspection.


Find Patent Forward Citations

Loading…