The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Jul. 25, 2014
Pro-micron Gmbh & Co. KG, Kaufbeuren, DE;
Kolja Wulff, Kaufbeuren, DE;
Pro-micron GmbH & Co. KG, Kaufbeuren, DE;
Abstract
A method for ascertaining deformations of a geometric body or for measuring forces or torques acting thereon using force measuring sensors or deformation measuring sensors. A plurality of such sensors are arranged on the geometric body in at least two groups. A first group of sensors registers forces acting on the geometric body or deformations of the geometric body in a first spatial direction with reference to a coordinate system fixed relative to the geometric body. A second group of sensors registers forces acting on the geometric body or deformations thereof in a second spatial direction with reference to the coordinate system fixed relative to the geometric body, which is independent of the first spatial direction. Signal outputs of the sensors are compared to one another for the purpose of registering and evaluating signals and for determining or assessing force components or deformation components acting in different spatial directions.