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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9518851 B1

PDFFull Text
Date of Patent:
Dec. 13, 2016

Filed:

Dec. 03, 2014

Probes for inspection system for substantially round hole

Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Robert William Bergman, Scotia, NY (US);

Thomas James Batzinger, Burnt Hills, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:

Ernest G. Cusick

Hoffman Warnick, LLC

Primary Examiner:

Paresh Patel

Int. Cl.
CPC ...
G01D 11/30 (2006.01); G01N 27/90 (2006.01); G01M 15/14 (2006.01); G01N 29/04 (2006.01); G01N 29/22 (2006.01);
U.S. Cl.
CPC ...
G01D 11/30 (2013.01); G01M 15/14 (2013.01); G01N 27/9006 (2013.01); G01N 29/043 (2013.01); G01N 29/225 (2013.01); G01N 2291/2636 (2013.01);
Abstract

Probes for an inspection system for a substantially round hole in a material are provided. One version of the probe may include a flexible sheet shaped and biased to substantially conform with a portion of an interior of the substantially round hole; and a plurality of sensors disposed on the flexible sheet, each sensor configured to transmit a non-destructive signal into the material for inspecting the substantially round hole.

Find Patent Forward Citations

Bergman, Robert. (2016). Probes for inspection system for substantially round hole (U.S. Patent No. 9518851). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9518851

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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