The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
May. 07, 2012
Applicants:
Michael Freedman, Redmond, WA (US);
Chetan Nayak, Redmond, WA (US);
Parsa Bonderson, Redmond, WA (US);
Inventors:
Michael Freedman, Redmond, WA (US);
Chetan Nayak, Redmond, WA (US);
Parsa Bonderson, Redmond, WA (US);
Assignee:
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 15/18 (2006.01); B82Y 10/00 (2011.01); G06N 99/00 (2010.01); G06N 5/02 (2006.01); G06Q 10/10 (2012.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
B82Y 10/00 (2013.01); G06N 99/002 (2013.01); G06N 5/02 (2013.01); G06N 99/005 (2013.01); G06Q 10/10 (2013.01); G06Q 30/02 (2013.01);
Abstract
Measurement-only topological quantum computation using both projective and interferometrical measurement of topological charge is described. Various issues that would arise when realizing it in fractional quantum Hall systems are discussed.