The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9517566 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 13, 2016

Filed:

May. 19, 2015
Applicant:

Hyundai Motor Company, Seoul, KR;

Inventor:

Jung Whan Yeum, Chungcheongbuk-do, KR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B66F 19/00 (2006.01); B25J 15/00 (2006.01);
U.S. Cl.
CPC ...
B25J 15/009 (2013.01);
Abstract

A test gripper is provided that decreases an equipment cost and increases a test precision by integrating and simplifying a jig and a test apparatus into the gripper. The test gripper is configured to align and test a component and includes a frame that has a mounting part installed on a robot arm. In addition, a plurality of pins are installed on the frame and are fitted into apertures of the component to align the component and the test gripper. A measuring sensor is also installed on the frame and is configured to test a precision of the component.


Find Patent Forward Citations

Yeum, Jung. (2016). Test gripper and test method using the same (U.S. Patent No. 9517566). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9517566

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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