The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2016
Filed:
Sep. 26, 2013
Universität Heidelberg, Heidelberg, DE;
Friedrich-schiller-universität Jena, Jena, DE;
Christoph Cremer, Heidelberg, DE;
Gerrit Best, Heidelberg, DE;
Roman Amberger, Bad Reichenhall, DE;
Rainer Heintzmann, Jena, DE;
Stefan Dithmar, Dossenheim, DE;
Thomas Ach, Scharzhofen, DE;
Ruprecht-Karls-Universität Heidelberg, Heidelberg, DE;
Friedrich-Schiller-Universität Jena, Jena, DE;
Abstract
A method for non-invasive observations of a fundus using an ophthalmoscope is provided. The method includes illuminating a retinal region of an eye by projecting an illumination pattern of illumination light onto the retinal region, at least one of detecting a portion of fluorescent light emitted from the retinal region and detecting a portion of illumination light reflected from the retinal region, thereby capturing a series of images of the retinal region at a plurality of different relative positions of the retinal region with respect to the illumination pattern projected onto the retinal region, wherein between the capturing of at least two images of the series the relative position of the retinal region with respect to the illumination pattern projected onto the retinal region is shifted in a non-controlled manner, and processing the captured images to extract a sub-resolution image of the retinal region.