The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Feb. 15, 2011
Applicants:

DO Hyung Park, Seoul, JP;

Sung Cheol Kim, Goyang-si, JP;

Eung Sun Kim, Suwon-si, KR;

Inventors:

Do Hyung Park, Seoul, JP;

Sung Cheol Kim, Goyang-si, JP;

Eung Sun Kim, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04W 4/02 (2009.01); H04W 64/00 (2009.01); H04W 16/20 (2009.01); H04W 4/18 (2009.01);
U.S. Cl.
CPC ...
H04W 4/02 (2013.01); H04W 4/025 (2013.01); H04W 4/185 (2013.01); H04W 16/20 (2013.01); H04W 64/00 (2013.01);
Abstract

Provided is an apparatus and method for expressing an accuracy of a measured location of a terminal. The apparatus may include a storage unit to store accuracy information used for indicating an accuracy of a measured location corresponding to each of possible locations of the terminal. The apparatus may include a location information obtainment unit to obtain information associated with a location of the terminal. The apparatus may include a controller to express an accuracy of a measured location in the location of the terminal or an accuracy of a measured location in an area comprising the location of the terminal, based on the accuracy information.


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