The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Aug. 24, 2015
Applicant:

Infobridge Pte. Ltd., Singapore, SG;

Inventor:

Min Jang, Seoul, KR;

Assignee:

INFORBRIDGE PTE. LTD., Singapore, SG;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/12 (2006.01); H04N 19/86 (2014.01); H04N 19/176 (2014.01); H04N 19/117 (2014.01); H04N 19/14 (2014.01); H04N 19/124 (2014.01); H04N 19/50 (2014.01); H04N 19/114 (2014.01); H04N 19/196 (2014.01); H04N 19/593 (2014.01); H04N 19/174 (2014.01);
U.S. Cl.
CPC ...
H04N 19/86 (2014.11); H04N 19/114 (2014.11); H04N 19/117 (2014.11); H04N 19/124 (2014.11); H04N 19/14 (2014.11); H04N 19/174 (2014.11); H04N 19/176 (2014.11); H04N 19/196 (2014.11); H04N 19/50 (2014.11); H04N 19/593 (2014.11);
Abstract

An apparatus of post-processing a reconstructed image is discussed. The apparatus according to an embodiment includes a deblocking filter for determining a boundary strength for each 4-sample edge which is a prediction edge or a transform edge and lies on 8×8 sample grid, determining whether deblocking filtering is applied on the 4-sample edge or not using the boundary strength and a boundary quantization parameter, and filtering the 4-sample edge if the deblocking filtering is applied on the 4-sample edge; and a sample adaptive offset adder for, if a sample adaptive offset type indicates an edge offset, generating an edge index of a current sample, generating an edge offset corresponding to the edge index to the current sample, and adding the edge offset to the current sample.


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