The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
Mar. 05, 2015
Applicant:
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Inventors:
Jeng-Yuan Yang, Garland, TX (US);
Youichi Akasaka, Allen, TX (US);
Motoyoshi Sekiya, Richardson, TX (US);
Takuji Maeda, Kawasaki, JP;
Hiroki Ooi, Kawasaki, JP;
Satoru Okano, Yokohama, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/079 (2013.01);
U.S. Cl.
CPC ...
H04B 10/07953 (2013.01);
Abstract
Methods and systems for in-band OSNR monitoring include a tunable optical filter to scan a passband of a desired optical channel. The optical power over the passband is measured and digitized to power waveform data. The power waveform data is processed with a digital signal processor to calculate OSNR. Additionally, various implementations accommodate dual polarization modulation formats using a parallel architecture and an alternating sequential architecture.