The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Sep. 02, 2014
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Kwang Hyup An, Rexford, NY (US);

Gautam Parthasarathy, Niskayuna, NY (US);

Jie Jerry Liu, Niskayuna, NY (US);

James Edward Pickett, Schenectady, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 51/44 (2006.01); H01L 27/30 (2006.01); G01N 23/04 (2006.01); H01L 51/00 (2006.01); G01T 1/20 (2006.01); H01L 51/42 (2006.01); H01L 51/52 (2006.01);
U.S. Cl.
CPC ...
H01L 51/448 (2013.01); G01N 23/04 (2013.01); G01T 1/2018 (2013.01); H01L 27/307 (2013.01); H01L 27/308 (2013.01); H01L 51/005 (2013.01); H01L 51/0032 (2013.01); H01L 51/0034 (2013.01); H01L 51/0036 (2013.01); H01L 51/0039 (2013.01); H01L 51/0043 (2013.01); H01L 51/4253 (2013.01); H01L 51/5259 (2013.01);
Abstract

An organic x-ray detector is presented. The organic x-ray detector includes a layered structure. The layered structure includes a thin-film transistor (TFT) array disposed on a substrate, an organic photodiode disposed on the TFT array, and a scintillator layer disposed on the organic photodiode. The organic x-ray detector further includes an encapsulation cover at least partially encapsulating the layered structure; and an oxygen getter layer disposed between the organic photodiode and the encapsulation cover, wherein the oxygen getter layer includes an ether-containing material. X-ray system including the organic x-ray detector is also presented.


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