The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Feb. 10, 2015
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Yasuhisa Inada, Osaka, JP;

Taku Hirasawa, Kyoto, JP;

Yoshitaka Nakamura, Osaka, JP;

Akira Hashiya, Osaka, JP;

Mitsuru Nitta, Osaka, JP;

Takeyuki Yamaki, Nara, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 33/00 (2010.01); H01L 33/58 (2010.01); H01L 33/50 (2010.01); H01L 27/118 (2006.01); H01L 31/0232 (2014.01); H01L 31/12 (2006.01);
U.S. Cl.
CPC ...
H01L 33/58 (2013.01); H01L 33/505 (2013.01); H01L 31/02322 (2013.01); H01L 31/12 (2013.01); H01L 31/125 (2013.01); H01L 33/00 (2013.01); H01L 2027/11853 (2013.01);
Abstract

A light-emitting device includes a photoluminescent layer that emits light containing first light, and a light-transmissive layer located on or near the photoluminescent layer. A submicron structure is defined on at least one of the photoluminescent layer and the light-transmissive layer. The submicron structure includes at least projections or recesses. The submicron structure has spatial frequency components distributed at least from more than 0 to 2/D(min) as determined by two-dimensional Fourier transform of a pattern of the projections or recesses and satisfies the following relationship:0.8(min)<λwhere D(min) is the minimum center-to-center distance between adjacent projections or recesses, λis the wavelength of the first light in air, and nis the refractive index of the photoluminescent layer for the first light.


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