The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Aug. 07, 2014
Applicant:

Dh Technologies Development Pte. Ltd., Singapore, SG;

Inventors:

Nic G. Bloomfield, Newmarket, CA;

Alexandre V. Loboda, Thornhill, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/42 (2006.01); H01J 49/00 (2006.01); H01J 49/02 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); H01J 49/025 (2013.01); H01J 49/40 (2013.01);
Abstract

Systems and methods are provided for correcting uniform detector saturation. In one method, a mass analyzer analyzes N extractions of an ion beam. A nonzero amplitude from an ADC detector subsystem is counted as one ion, producing a count of one for each ion of each sub-spectrum. The ADC amplitudes and counts of the N sub-spectra are summed, producing a spectrum that includes a summed ADC amplitude and a total count for each ion of the spectrum. A probability that the total count arises from single ions hitting the detector is calculated. For each ion of the spectrum where the probability exceeds a threshold value, an amplitude response is calculated, producing amplitude responses for ions found to be single ions hitting the detector. Amplitude responses are combined, producing a combined amplitude response. The total count is dynamically corrected using the combined amplitude response and the summed ADC amplitude.


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