The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Aug. 26, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Aravindan J. Busi, Karnataka, IN;

Kevin W. Gorman, Fairfax, VT (US);

Kiran K. Narayan, Hyderabad, IN;

Michael R. Ouellette, Westford, VT (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/44 (2006.01); G11C 29/38 (2006.01); G01R 31/3193 (2006.01); G01R 31/3187 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G01R 31/3187 (2013.01); G11C 29/44 (2013.01); G01R 31/31935 (2013.01);
Abstract

Logic and methods for diagnostic testing of memory and, more particularly, auto shift of failing memory diagnostics data using pattern detection are disclosed. The method includes detecting fails in the memory during a built in self test (BIST) pattern. The method further includes passing the fail information to a tester through a diagnostic pin. The method further includes pausing shift operations when it is determined that the shifting of the fail information is complete for the detected fail.


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