The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
May. 09, 2013
Applicant:
Laboratoires Bodycad Inc., Quebec, CA;
Inventor:
Geoffroy Rivet-Sabourin, Stoneham, CA;
Assignee:
LABORATOIRES BODYCAD INC., Québec, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G01R 33/56 (2006.01); G06T 17/20 (2006.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06T 7/0083 (2013.01); G01R 33/5608 (2013.01); G06T 7/0089 (2013.01); G06T 7/0091 (2013.01); G06T 17/20 (2013.01); G06T 19/20 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20116 (2013.01); G06T 2207/30008 (2013.01);
Abstract
There is described herein an image segmentation technique using an iterative process. A contour, which begins with a single point that expands into a hollow shape, is iteratively deformed into a defined structure. As the contour is deformed, various constraints are applied to points along the contour to dictate its rate of change and direction of change are modified dynamically. The constraints may be modified after one or more iterations, at each point along the contour, in accordance with newly measured or determined data.