The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Jun. 08, 2012
Applicants:

Matthew Tyler Wilkinson, Pittsburgh, PA (US);

Grant B. Fresen, Pittsburgh, PA (US);

Nicholas B. End, Pittsburgh, PA (US);

Michael Lin, Pittsburgh, PA (US);

Inventors:

Matthew Tyler Wilkinson, Pittsburgh, PA (US);

Grant B. Fresen, Pittsburgh, PA (US);

Nicholas B. End, Pittsburgh, PA (US);

Michael Lin, Pittsburgh, PA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A43D 1/06 (2006.01); G06Q 30/06 (2012.01); A41H 1/00 (2006.01); G01B 21/20 (2006.01); A43D 1/02 (2006.01);
U.S. Cl.
CPC ...
G06Q 30/0631 (2013.01); A41H 1/00 (2013.01); A43D 1/02 (2013.01); A43D 1/06 (2013.01); G01B 21/20 (2013.01);
Abstract

A system for measuring dimensions and/or other internal properties of a shoe, garment or other object of interest is described. The system includes a fixture having a measurement tip. When the tip is placed inside of the object of interest, a processor collects positional data from the fixture to develop a three-dimensional model of the interior of the object. If the measurement tip includes one or more pressure sensors, the processor may collect pressure data and use the pressure data to include stretch properties in the three-dimensional model.


Find Patent Forward Citations

Loading…