The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Jan. 31, 2012
Applicants:

Craig M. Gardner, Belmont, MA (US);

Robert L. Green, Haverhill, MA (US);

Inventors:

Craig M. Gardner, Belmont, MA (US);

Robert L. Green, Haverhill, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06F 19/24 (2011.01); G06K 9/00 (2006.01); G06K 9/38 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00543 (2013.01); G06K 9/38 (2013.01); G06K 9/6212 (2013.01); G06K 9/6215 (2013.01); G06F 19/24 (2013.01);
Abstract

A processing application receives peak information associated with multiple known references samples. The processing application partitions a spectrum into multiple different sized range bins such that a substantially equal number of the peaks associated with the known reference samples reside into each of the multiple different sized range bins. To identify a set of candidate reference samples in a library of reference samples that potentially are a good match an unknown sample under test, the processing application compares peaks associated with the unknown sample to the multiple different sized range bins. The greater the number of range bin matches based on peaks in the unknown sample and peaks in a corresponding reference sample, the greater the likelihood that the unknown sample matches the corresponding reference sample.


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