The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
Mar. 21, 2013
The Trustees of Columbia University IN the City of New York, New York, NY (US);
Elisa Konofagou, New York, NY (US);
Jean Provost, New York, NY (US);
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK, New York, NY (US);
Abstract
Systems and methods for matching a characteristic of multiple sectors of a moving tissue to verify an overlap thereof are disclosed herein. In an exemplary method, tissue data for at least a first sector and a second sector of a moving tissue is acquired. A characteristic of at least a portion of the first and second sectors is estimated from the acquired tissue data, and the estimated characteristics are matched to verify whether a portion of the first sector overlaps with a portion of the second sector. Estimating can include estimating a displacement such as an axial displacement and/or lateral displacements. Estimating can further include estimating a strain, a velocity, a strain rate and/or a stiffness or equivalent.