The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Nov. 08, 2011
Applicants:

Andy Shen, Bellevue, WA (US);

Vikram Desai, Redmond, WA (US);

Vladimir Pogrebinsky, Sammamish, WA (US);

Inventors:

Andy Shen, Bellevue, WA (US);

Vikram Desai, Redmond, WA (US);

Vladimir Pogrebinsky, Sammamish, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 11/36 (2006.01); G06F 17/30 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3616 (2013.01); G06F 8/77 (2013.01); G06F 17/30994 (2013.01);
Abstract

Metrics are defined and collected for an application. The metrics are organized in hierarchical trees with metrics aggregated at each node in the trees. Each tree represents a different permutation of the metrics. A particular metric may occur in more than one tree. A user interface provides a default drill-down that allows users to jump from one metric to another so that only the most useful information is presented to the user. The default drill-down is defined to provide the user with a best practices method to identify and correct problems or errors in the application. Users may modify the default drill-down path.


Find Patent Forward Citations

Loading…