The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
Feb. 06, 2013
Aspen Technology, Inc., Burlington, MA (US);
Qingsheng Quinn Zheng, Sugar Land, TX (US);
Magiel J. Harmse, Houston, TX (US);
Aspen Technology, Inc., Bedford, MA (US);
Abstract
An integrated multivariable predictive controller (MPC) and tester is disclosed. The invention system provides optimal control and step testing of a multivariable dynamic process using a small amplitude step for model identification purposes, without moving too far from optimal control targets. A tunable parameter specifies the trade-off between optimal process operation and minimum movement of process variables, establishing a middle ground between running a MPC on the Minimum Cost setting and the Minimum Move setting. Exploiting this middle ground, embodiments carry out low amplitude step testing near the optimal steady state solution, such that the data is suitable for modeling purposes. The new system decides when the MPC should run in optimization mode and when it can run in constrained step testing mode. The invention system determines when and how big the superimposed step testing signals can be, such that the temporary optimization give-away is constrained to an acceptable range.