The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
Jun. 18, 2008
Daniel H. Carlson, Arden Hills, MN (US);
Dale L. Ehnes, Cotati, CA (US);
Daniel S. Wertz, Sebastopol, CA (US);
Luis A. Aguirre, Austin, TX (US);
Levent Biyikli, Cedar Park, TX (US);
Alan B. Campbell, Oakdale, MN (US);
Daniel H. Carlson, Arden Hills, MN (US);
Dale L. Ehnes, Cotati, CA (US);
Daniel S. Wertz, Sebastopol, CA (US);
Luis A. Aguirre, Austin, TX (US);
Levent Biyikli, Cedar Park, TX (US);
Alan B. Campbell, Oakdale, MN (US);
3M INNOVATIVE PROPERTIES COMPANY, St. Paul, MN (US);
Abstract
Methods and systems for forming a displacement scale comprising TIR prisms on a substrate are described. A system for forming the displacement scale includes one or more rollers having a pattern of total internal reflection (TIR) prism features in negative relief. As the rollers are rotated, the scale is formed on the substrate. The rollers may also include pattern features in negative relief. Rotation of the rollers simultaneously forms the displacement scale and the pattern features on the substrate. The TIR prism features of the displacement scale may be oriented to provide measurement of one or more of lateral displacement, longitudinal displacement and angular displacement.