The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
May. 09, 2012
Yasuhiro Kamada, Tokyo, JP;
Masahiro Takizawa, Tokyo, JP;
Yasuhiro Kamada, Tokyo, JP;
Masahiro Takizawa, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
In order to improve contrast and image quality in non-orthogonal measurement without sacrificing speed, in imaging which combines a fast imaging sequence for acquiring a plurality of echo signals in one shot with non-orthogonal system measurement, the shape of a blade in which an echo train of each shot is arranged includes a fan-shaped region having the radius and the arc of a circle centered on the origin of the k space, and a region overlapping an adjacent blade. During measurement, control is performed such that an echo signal for desired TE of each blade is arranged in a low spatial frequency region of a k space, and during image reconstruction, body motion between the blades is corrected using data of the overlapping regions.