The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Jan. 20, 2015
Applicant:

Hitachi Metals, Ltd., Tokyo, JP;

Inventors:

Ken Okuyama, Hitachi, JP;

Naofumi Chiwata, Mito, JP;

Katsuya Akimoto, Hitachi, JP;

Naoki Futakuchi, Hitachinaka, JP;

Yukio Ikeda, Hitachi, JP;

Kazuhisa Takahashi, Hitachi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 15/00 (2006.01); G01R 19/00 (2006.01); G01R 33/09 (2006.01); G01R 15/20 (2006.01);
U.S. Cl.
CPC ...
G01R 19/0092 (2013.01); G01R 15/207 (2013.01); G01R 33/093 (2013.01); G01R 15/205 (2013.01);
Abstract

A current detection structure includes a busbar to flow a current therethrough, a magnetic detection element to detect a strength of a magnetic field generated by the current flowing through the busbar, and a current detecting portion to determine the current flowing through the busbar based on the magnetic field detected by the magnetic detection element. A through-hole is formed penetrating the busbar such that a current path is formed on both sides of the through-hole. The magnetic detection element is disposed in the through-hole. The current detecting portion determines the current flowing through the busbar based on a strength of a synthetic magnetic field detected by the magnetic detection element. The synthetic magnetic field is produced by combining a magnetic field that is generated by a current flowing through the current path on the both sides of the through-hole.


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