The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Mar. 05, 2013
Applicant:

Sysmex Corporation, Kobe-shi, JP;

Inventors:

Takuma Katou, Kobe, JP;

Daigo Fukuma, Kobe, JP;

Yuichi Hamada, Kobe, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/50 (2006.01); G01N 33/80 (2006.01); G01N 33/72 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5094 (2013.01); G01N 33/726 (2013.01); G01N 33/80 (2013.01); G01N 35/00603 (2013.01); G01N 35/026 (2013.01);
Abstract

Provided are a sample analyzer and sample analyzing method capable of performing proper and efficient analysis by fitting measurement items of a sample to the patient. A sample analyzerobtains a patient ID and measurement order from a laboratory hostbased on the sample ID read from a barcode label Tof a sample container T via a barcode reader B, and the measurement items of the obtained measurement order are recorded in a work list. The sample analyzeralso prepares revised measurement items based on past measurement results corresponding to the obtained patient ID. The sample analyzerreplaces the measurement items of the work list with the revised measurement items when the revised measurement items satisfy predetermined conditions, and measures and analyzes the sample according to the replacement measurement items.


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