The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
Aug. 08, 2013
Logan Chieffo, Cambridge, MA (US);
Richard Averitt, Newton, MA (US);
Andrew Speck, Milton, MA (US);
Michael M. Herron, Cambridge, MA (US);
A. Ballard Andrews, Wilton, CT (US);
Ronald E. G. Van Hal, Belmont, MA (US);
Logan Chieffo, Cambridge, MA (US);
Richard Averitt, Newton, MA (US);
Andrew Speck, Milton, MA (US);
Michael M. Herron, Cambridge, MA (US);
A. Ballard Andrews, Wilton, CT (US);
Ronald E. G. Van Hal, Belmont, MA (US);
SCHLUMBERGER TECHNOLOGY CORPORATION, Sugar Land, TX (US);
Abstract
A method of analyzing physical properties of a sample includes obtaining the sample and obtaining an electromagnetic spectrum of the sample using terahertz spectroscopy. A sample complex permittivity is computed from the electromagnetic spectrum of the sample. The method further includes estimating the constituents and the constituent fractions and computing an estimated effective complex permittivity based upon a model and the constituent fractions. The method further includes comparing the computed sample complex permittivity with the estimated effective complex permittivity in order to determine the physical properties the sample.