The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Mar. 27, 2014
Applicant:

Sysmex Corporation, Kobe-shi, Hyogo, JP;

Inventors:

Kazuhiro Yamada, Kobe, JP;

Takeshi Yamamoto, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 35/02 (2006.01); G01N 15/10 (2006.01); G01N 15/00 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1436 (2013.01); G01N 15/1459 (2013.01); G01N 15/1463 (2013.01); G01N 35/026 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/1006 (2013.01); G01N 2035/00356 (2013.01); G01N 2035/0415 (2013.01);
Abstract

A particle measuring apparatus comprising a flow cell configured to flow a specimen, a first light source configured to emit light having a first wavelength, a second light source configured to emit light having a second wavelength different from the first wavelength, an irradiation optical system configured to irradiate the flow cell with light emitted from the first light source and the second light source, a first light receiving portion configured to receive scattered light obtained by irradiating a measurement particle passing through the flow cell with light from the first light source, and a second light receiving portion configured to receive scattered light obtained by irradiating a measurement particle passing through the flow cell with light from the second light source.


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