The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Nov. 08, 2013
Applicant:

Ofs Fitel, Llc, Norcross, GA (US);

Inventors:

Xinli Jiang, Shrewsbury, MA (US);

Thierry F Taunay, Bridgewater, NJ (US);

Assignee:

OFS FITEL, LLC, Norcross, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/33 (2013.01);
Abstract

Apparatus and method of simultaneously measuring a parameter of a plurality of cores in at least one optical fiber. An input tester at a first end of the test fiber has a plurality of tester signal inputs with a geometry substantially matching at least a portion of the core geometry of the fiber. At least one test input signal source coupled to the plurality of tester signal inputs. A signal measuring device is alignable at a second end of the fiber to measure the output of the test input signal. The input tester may include a tapered multicore coupler or a laser having a shield with apertures disposable between the laser and the fiber. In the latter case, a lens may be disposed between the shield and the fiber to project light from the laser that passes through the apertures onto the end of the fiber.


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