The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
Sep. 25, 2013
National University Corporation Kagawa University, Takamatsu-shi, Kagawa, JP;
Ichiro Ishimaru, Takamatsu, JP;
NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY, Takamatsu-shi, JP;
Abstract
A spectroscopic measurement device includes a dark filter that is arranged on an optical path between an imaging optical system and a light detection unit and includes a plurality of regions having different transmittances, the filter being configured such that a fixed reflected measurement light and a movable reflected measurement light that are guided to a same point by the imaging optical system and form interference light are transmitted through a same region; and an arithmetic processing unit that obtains an interferogram of the measurement light at a transmittance corresponding to each of two or more regions from a detection signal of each pixel of a light detection unit when a movable reflection unit is moved, and obtains a spectrum of the measurement light based on the interferogram.