The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
Mar. 07, 2014
Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;
Masaki Yamazaki, Fuchu, JP;
Akihito Seki, Yokohama, JP;
Satoshi Ito, Kawasaki, JP;
Yuta Itoh, Kawasaki, JP;
Hideaki Uchiyama, Kawasaki, JP;
Ryuzo Okada, Kawasaki, JP;
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Abstract
According to an embodiment, a measuring device includes a projector, an image capturing unit, and a first calculator. The projector projects, onto a target, a first superimposed pattern which is obtained by superimposing a first pattern having a periodic change and a second pattern configured with a first design for specifying a period of the first pattern. The image capturing unit captures the target, onto which the first superimposed pattern is projected to obtain an image. The first calculator performs matching of the first design taken by the image capturing unit, which is included in the first superimposed pattern in the image, with the first design projected by the projecting unit, and calculates correspondence between a second superimposed pattern, which points to the first superimposed pattern captured in the image, and the first superimposed pattern.