The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
Mar. 12, 2013
Amo Development, Llc, Santa Ana, CA (US);
Anatoly Fabrikant, Fremont, CA (US);
AMO Development, LLC, Santa Ana, CA (US);
Abstract
Systems and methods for measuring a topography of an optical tissue surface of an eye are provided by combining a measured elevation of the surface with a priori information of the surface to provide an estimate of mean and covariance of post-measurement orthogonal polynomial sequence amplitudes associated with the surface, determining a variance of elevation of the surface from the estimate, and constructing the topography from the estimate of mean and covariance of post-measurement amplitudes based on a comparison of the variance of elevation of the surface with a pre-determined threshold. The a priori information includes an estimate of mean and covariance of pre-measurement orthogonal polynomial sequence amplitudes associated with the surface.