The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
Aug. 31, 2012
Applicants:
Kiyomi Wada, Tokyo, JP;
Mineyoshi Masuda, Tokyo, JP;
Kentaro Watanabe, Tokyo, JP;
Inventors:
Assignee:
HITACHI, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 12/14 (2006.01); G08B 23/00 (2006.01); H04L 29/06 (2006.01); G06F 11/34 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1408 (2013.01); G06F 11/3409 (2013.01); G06F 11/3495 (2013.01); G06F 11/00 (2013.01); G06F 11/07 (2013.01); G06F 11/0748 (2013.01); G06F 2201/81 (2013.01); G06F 2201/875 (2013.01); H04L 63/1425 (2013.01);
Abstract
A monitoring system for monitoring a service execution infrastructure for providing a service to client computers via a network manages baselines of monitoring values of components per load of the service provided by the infrastructure, and uses the baselines depending on a current service load. When detecting an abnormality of a service monitoring value or component monitoring value by use of the baselines, the monitoring system compares events up to predetermined minutes ago from now with events in the baseline time zone thereby to specify a differential event (or non-normal recent event).