The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2016
Filed:
Mar. 14, 2011
Applicants:
Akihiko Yoshikawa, Chiba, JP;
Yoshihiro Ishitani, Chiba, JP;
Kazuhide Kusakabe, Chiba, JP;
Inventors:
Assignee:
NATIONAL UNIVERSITY CORPORATION CHIBA UNIVERSITY, Chiba-shi, Chiba, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/49 (2006.01); H01S 5/343 (2006.01); B82Y 20/00 (2011.01); H01L 33/18 (2010.01); H01L 33/32 (2010.01); H01L 31/0304 (2006.01); H01L 31/0368 (2006.01); H01L 31/075 (2012.01); H01L 31/105 (2006.01); H02S 50/10 (2014.01); H01L 33/02 (2010.01);
U.S. Cl.
CPC ...
H01S 5/34333 (2013.01); B82Y 20/00 (2013.01); H01L 31/03046 (2013.01); H01L 31/0368 (2013.01); H01L 31/075 (2013.01); H01L 31/105 (2013.01); H01L 33/18 (2013.01); H01L 33/32 (2013.01); H02S 50/10 (2014.12); H01L 33/025 (2013.01); H01S 2301/17 (2013.01); Y02E 10/544 (2013.01); Y02E 10/548 (2013.01); Y02P 70/521 (2015.11);
Abstract
A photoelectric conversion device which inhibits characteristic degradation caused by crystal defects, and an inspection method for crystal defects in photoelectric conversion devices. The photoelectric conversion device is provided with an active layer, and a deactivator contained in the active layer.