The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Dec. 08, 2015
Applicant:

Futurewei Technologies, Inc., Plano, TX (US);

Inventor:

Hongmin Chen, Davis, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/10 (2006.01); H01S 5/06 (2006.01); H01S 5/00 (2006.01); H01S 3/106 (2006.01); H01S 5/30 (2006.01);
U.S. Cl.
CPC ...
H01S 5/0612 (2013.01); H01S 3/1062 (2013.01); H01S 5/0014 (2013.01); H01S 5/3013 (2013.01);
Abstract

A laser comprises a gain medium, and a mirror coupled to the gain medium and comprising a coupler coupled to the gain medium, a phase section coupled to the coupler, a bandpass filter coupled to the phase section, and a comb reflector (CR) coupled to the bandpass filter. A laser chip package comprises a substrate, and a laser coupled to the substrate and comprising a filter comprising a first interferometer with a first transmittance, and a second interferometer with a second transmittance, wherein the filter is configured to provide a filter transmittance based on the first transmittance and the second transmittance, and a comb reflector (CR) coupled to the filter and comprising a ring with a circumference, and a refractive index, wherein the CR is configured to provide a CR reflectivity based on the circumference and the refractive index.


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