The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Mar. 15, 2012
Applicants:

Hermann Wollnik, Santa Fe, NM (US);

Gary A. Eiceman, Las Cruces, NM (US);

Inventors:

Hermann Wollnik, Santa Fe, NM (US);

Gary A. Eiceman, Las Cruces, NM (US);

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 27/62 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0031 (2013.01); G01N 27/622 (2013.01); H01J 49/0422 (2013.01);
Abstract

An ion mobility spectrometer having an ion source for generating ions; an ion detector for recording ions, and a number of substantially flat diaphragm electrodes arranged substantially perpendicular to a straight system axis that passes through the apertures in said diaphragms, with the diaphragms being arranged in a series of cells with each cell including an entrances and an exit diaphragm and a short region in between. The exit diaphragm of one cell is identical to the entrance diaphragm of the next cell, and the cells of said ion mobility spectrometer are grouped into three parts: an ion-beam forming region, an ion analyzing region, and a decelerating ion gate.


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